Why you should register?


Speakers
Keynote

Muhammad Mustafa Hussain
UC Berkeley, USA
Anomalous Mechanical Deformation – New Variable in Reliability for Flexible and Stretchable CMOS Electronics

Noah Lassar
Waymo, USA
Reliability Insights from 25 Million Fully Autonomous Miles

Professor Aaron Thean
National University of Singapore, Singapore
What’s wrong with my chip? – Dr. AI, can you please diagnose?
Tutorial

Dr. Franco Stellari
IBM, USA
Faster fault isolation with advanced data analysis and computer vision

Dr. Jong-Shing Bow
iST Group, Taiwan
Introduction of TEM/STEM Techniques and Some Puzzles of Them in Analyzing Nano Materials

Dr. Umberto Celano
Retain IMEC, Belgium
University of Twente, Netherlands
Scanning Probe Microscopies for Correlative Analysis of Advanced Technology Nodes

Professor Massimo Vanzi
University of Cagliari, Italy
Laser Diodes: an introductory Tutorial

Professor Christian Boit
Technische Universität Berlin, Germany
Contactless Fault Isolation Techniques and IC Hardware Security

Professor Tan Chuan Seng
Nanyang Technological University, Singapore
3D IC Process Technology – Drivers, Technology Platforms, Challenges & Solutions

Professor Tuo-Hung Hou
National Chiao Tung University, Taiwan
Robust and Reliable Design for In-Memory Computing

Dr. Oliver Aubel
Global Foundries, Germany
Automotive Reliability Requirements & Challenges for Semiconductor Foundries
Invited

Professor Xing Wu
East China Normal University, China
ESD failure analysis by using transmission electron microscopy at the atomic scale

Dr. Alok Ranjan
Singapore University of Technology and Design, Singapore
Dielectric Breakdown in Hexagonal Boron Nitride

Professor Weidong Zhang
Liverpool John Moore University, United Kingdom
Reliability and Characterization of GeSe OTS Selector Device

Dr. I-Ting Wang
National Yang Ming Chiao Tung University, Taiwan
Evaluation of Breakdown Interference and Strategy of Mitigating Yield Loss in Crossbar Memory Arrays

Dr Steven H Voldman
Dr. Steven H Voldman LLC, USA
Latchup: From the beginning to today

Dr Yuan Yuan Shi
IMEC, Belgium
Wafer-scale epitaxial 2D transition metal dichalcogenides for high-performance scaled transistors

Dr Markus Herklotz
Global Foundries, Germany
BEOL Reliability Challenges using advanced nodes for automotive applications

Mr. Jayant D'Souza
Siemens Digital Industries Software, USA
Localization of Front-End Defects using Volume Scan Diagnosis

Dr. Francesco Puglisi
Università degli Studi di Modena e Reggio Emilia, Italy
Random Telegraph Noise for Advanced True Random Number Generation in the IoE ecosystem

Professor Christian Boit
Technische Universität Berlin, Germany
Logic state imaging - From FA techniques for special applications to one of the most powerful hardware security side-channel threats

Dr. Franco Stellari
IBM, USA
Tool automation and computer vision methodologies for faster IC diagnostics

Professor Tan Chuan Seng
Nanyang Technological University, Singapore
3D MIM Capacitor Embedded in TSV: Concept, Device Demonstration, Reliability and Applications

Professor Massimo Vanzi
University of Cagliari, Italy
Wave aspects in Laser Diode Catastrophic Optical Damage